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Curr. Opt. Photon. 2021; 5(5): 524-531
Published online October 25, 2021 https://doi.org/10.3807/COPP.2021.5.5.524
Copyright © Optical Society of Korea.
Shariar Md Imtiaz1, Ki-Chul Kwon1, Md. Shahinur Alam1, Md. Biddut Hossain1, Nam Changsup2, Nam Kim1
Corresponding author: namkim@chungbuk.ac.kr, ORCID 0000-0001-8109-2055
This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0/) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
In an integral-imaging microscopy (IIM) system, a microlens array (MLA) is the primary optical element; however, surface errors impede the resolution of a raw image’s details. Calibration is a major concern with regard to incorrect projection of the light rays. A ray-tracing-based calibration method for an IIM camera is proposed, to address four errors: MLA decentering, rotational, translational, and subimage-scaling errors. All of these parameters are evaluated using the reference image obtained from the ray-traced white image. The areas and center points of the microlens are estimated using an “8-connected” and a “center-of-gravity” method respectively. The proposed approach significantly improves the rectified-image quality and nonlinear image brightness for an IIM system. Numerical and optical experiments on multiple real objects demonstrate the robustness and effectiveness of our proposed method, which achieves on average a 35% improvement in brightness for an IIM raw image.
Keywords: Integral imaging microscopy system, Microlens array, Microscopy camera calibration, Rectification of microlens image
OCIS codes: (100.2980) Image enhancement; (110.0180) Microscopy; (110.3000) Image quality assessment; (110.3010) Image reconstruction techniques
Integral-imaging microscopy (IIM) is a three-dimensional (3D) microscopy modality that senses differences in color intensity and depth within a single frame, through a microlens array (MLA) [1]. It provides detailed information on parallax and depth for various applications, including digital imaging involving super-resolution [2–4], depth mapping [5, 6], and 3D reconstruction [7]. In 1908, Gabriel Lippmann invented the first light-field camera, which he referred to as an “integral photography” device [8]; this camera had a carefully spaced lens array, to allow multiple photographs to be taken of a scene. Since its introduction, this camera has undergone numerous modifications, including changes in the camera array. Hand-held models have also been introduced [9].
In the basic IIM configuration, the elemental-image array (EIA) captured by the MLA holds a collection of subimages arranged in a particular sequence for 3D reconstruction [10], as shown in Fig. 1. The main purpose is to ensure efficient use of the IIM data during the processing and restoration of 3D images, where the raw image contains the depth information of the estimated target. However, fabrication and assembly limitations lead to defects in MLAs, including rotational [11, 12], translational [12], decentering [13], and pitch [11] errors. These errors diminish the quality, brightness, and resolution of the captured image, and make it difficult to determine the MLA’s location [13]. A large amount of detail in the raw image is lost or distorted, resulting in a significant decrease in target flow efficiency [14, 15]. Therefore, it is necessary to correct the distortions in IIM images caused by MLA errors.
Different calibration methods for microlens-based cameras have been suggested. Recent advances in light-field-camera technology have improved the precision of more recent configurations. Su
The methods in the abovementioned studies tend to idealize the MLA’s surface parameters, and only consider image distortion. However, the surface error of the MLA and its image-distortion error are not constant [21, 22]. Therefore, local deterioration caused by microlens surface errors cannot be efficiently rectified by integral methods; moreover, such techniques suffer from considerable computational complexity and negligible correction effects. The rotation-angle calculation depends on positional data, and involves precalculation of the system’s intrinsic parameters; this increases the required time and complexity of computations. There are also various, unavoidable device faults, such as distortion of the main lens, MLA translational errors, and scaling-factor errors between optical components.
In this study, we develop an IIM-camera calibration method based on ray tracing of the image, to address four types of error: MLA decentering, rotational, translational, and subimage-scaling errors. The effectiveness and reliability of the method are verified by comparing real-object images of different targets, before and after correction.
The IIM system consists of an objective lens, tube lens, MLA, and charge-coupled device (CCD). Fig. 1 illustrates the structural layout of the IIM-system model, in which the MLA is placed between the microscopy tube lens and CCD image sensor. Light information passes through the objective lens and microlenses of the MLA. An EIA is captured by the CCD, which in turn forms a series of subimages. An orthographic-view image (OVI) is produced from the EIA image’s information [10].
Suppose a specimen point with an initial coordinate (
where
Each microlens in the IIM camera forms a subimage on the CCD sensor that matches the directional light information. To acquire the correct image, the microlenses should be arranged in a matrix format, with parallel positioning of the image-sensor plane and MLA plane, in which the light rays strike each microlens at a different angle or projection. In the manufacturing and assembly process, the MLA is not aligned precisely with the image sensor. If there is an angle between the MLA and image sensor, rotational error occurs, as shown in Fig. 3(a).
In the IIM camera, translational error in the MLA leads to blurring and poor-quality digitally refocused images. Each microlens forms a subimage on the CCD sensor that corresponds to directional light information. When the microlenses are arranged, a fixed matrix format is needed for efficient use of the sensor pixels and subimages, with no crosstalk. Under this condition, any deviation in the horizontal or vertical position of the microlenses from their assumed, standard matrix position introduces translational error, as shown in Fig. 3(b).
In the MLA, deviation of the lens diameter of the microlens surface from the standard diameter introduces a scaling-factor error, as shown in Fig. 3(c). The lens-diameter selection is important, because it determines the light-propagation characteristics and field angle. The scaling process tends to maximize an object’s dimensions, based on its original coordinates, to achieve the desired result.
Analyses have shown that, in some subimages of the light field picture, error is caused by significant distortion related to a change in position, border scattering, and brightness variation [13]. Here, we introduce a method for calibrating a distorted IIM image using raw white images, as described in the following steps in Fig. 4.
To calibrate the error of an IIM image, a white-scene image consisting of 1856 × 1856 pixels is captured; notably, this image must be both white and homogeneous. A region of interest (ROI) is selected by cropping (
Here
The MLA translational error is illustrated in Fig. 6. Extracting the subimage from a white image is an important precondition for identifying the microlens gravity-index-shift error in the MLA as shown in Fig. 6(b). Each subimage contains 29 × 29 pixels. The subimage is transformed to a grayscale image, and Otsu’s method [23, 24] is utilized to convert the grayscale image to a binary one, as shown in Fig. 6 (c). For the binary image, we define each microlens as a distinct region using the circle-detection method. Fig. 6(d) presents the intermediate results of these steps. In this proposed method, the average translation position is calculated for each row and column based on the microlens’s center-pixel position, from which any deviation results in translational error. As a result, the original position is shifted to the average center direction, as shown in Fig. 7(b).
To address scaling-factor error, the subimage’s center position and area of light intensity must first be calculated. The determined scaling factor is applied to convert the original subimage to the maximum lenslet area, as shown in Fig. 7(c). In our experiments the maximum size of a single lenslet’s area is 29 × 29 pixels. The bilinear-interpolation technique is then utilized to maximize the subimage.
In this experiment we use a BX41 microscope (Olympus, Tokyo, Japan), as shown in Fig. 8, consisting of an objective lens, tube lens, lens array, CCD, and control computer. The lens array is arranged in a 100 × 100 square matrix. Each lenslet has an area of 125 × 125 µm2 and a spherical surface. Our method is implemented in the MATLAB® environment. Detailed specifications of the optical components and personal computer are given in Table 1.
TABLE 1 Specifications of the proposed Integral-imaging microscopy (IIM) calibration system
Optical devices | Specifications | |
---|---|---|
IIM Unit | Objective lens | ×10 |
Tube lens | ×10 | |
MLA | Number of lens array | 100 × 100 (ROI 64 × 64) |
Elemental lens pitch | 125 μm | |
Camera | Sensor resolution | 2048 × 2048 pixels (RGB) |
Pixel pitch | 5.5 μm | |
Focal length | 2.4 mm | |
User PC | Frame rate | 90 fps |
CPU | Intel Core i5-9400F 2.9 GHz | |
Memory | 16 GB | |
Operating system | Windows 10 Pro (64-bit) |
The rectification method [25] is compared to the proposed method to verify the effectiveness, in terms of structural similarity index (SSIM) and mean squared error (MSE) values. In this system the MLA rotational errors are set from 0.1° to 1.0°. The comparison of results is shown in Fig. 9, based on different rotational factors. We find that the proposed method outperforms the traditional one in all cases. The SSIM and MSE values are almost similar.
Using the IIM method, our calibration method is applied to the IIM images of four specimens. Figure 10 shows the corresponding images, which include (i) a 2D image, (ii) the EIA used to capture the directional-view images, (iii) the initial OVI reconstructed using the computational integral-imaging reconstruction (CIIR) [26, 27] algorithm, and (iv) the final reconstructed OVI image. In this experiment the brightness of the initial OVI is not uniform, as shown in Fig. 10(iii). The image’s brightness improves after applying our proposed calibration method, as shown in Fig. 10(iv).
Figure 11 shows the percentage of bright pixels in each of the four initial and calibrated specimen OVIs. Our experimental results show that the proposed calibration method successfully enhances the uniform brightness of the images in the directional view. It is observed that the images of the microchip and sand crystal enjoy better results than those of the fly and mosquito, because of the light information. We can see from Fig. 10 that the microchip and sand crystal are brighter, causing more light reflection. Calibration does not have a huge effect on the weak-light-source area. For the same reason, the mosquito sample exhibits the worst performance.
In this work, we introduced a ray-tracing-based MLA calibration method for an IIM system. The goal was to minimize errors in MLA alignment, and thus improve image quality and brightness. The proposed method attenuated MLA errors using a reference image. An efficient error-detection and -correction method was proposed, in which a four-step calibration process is employed for EIA processing. Experiments with real IIM images showed that the proposed calibration method can accommodate nonlinear MLA errors to achieve an enhanced, error-free IIM image with improved brightness uniformity. Our experimental results for four images of various specimens (a fly, a microchip resistor, a mosquito, and a sand crystal) demonstrate that the proposed method has the robustness needed to correct for various errors. Future work is expected to include a more advanced lens-distortion model, which should improve the accuracy of the IIM image-capturing system by overcoming the various complexities associated with the microscope.
This work was supported by the National Research Foundation of Korea (NRF) (NRF-2018R1D1A3B07044041, NRF-2020R1A2C1101258), and was supported under the Grand Information Technology Research Center support program (IITP-2020-0-01462) supervised by the IITP (Institute for Information & communications Technology Planning & Evaluation), grant funded by the Korean government.
Curr. Opt. Photon. 2021; 5(5): 524-531
Published online October 25, 2021 https://doi.org/10.3807/COPP.2021.5.5.524
Copyright © Optical Society of Korea.
Shariar Md Imtiaz1, Ki-Chul Kwon1, Md. Shahinur Alam1, Md. Biddut Hossain1, Nam Changsup2, Nam Kim1
1School of Information and Communication Engineering, Chungbuk National University, Cheongju 28644, Korea
2Department of Mechanical ICT Engineering, College of Future Convergence, Hoseo University, Cheonan 31066, Korea
Correspondence to:namkim@chungbuk.ac.kr, ORCID 0000-0001-8109-2055
This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0/) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
In an integral-imaging microscopy (IIM) system, a microlens array (MLA) is the primary optical element; however, surface errors impede the resolution of a raw image’s details. Calibration is a major concern with regard to incorrect projection of the light rays. A ray-tracing-based calibration method for an IIM camera is proposed, to address four errors: MLA decentering, rotational, translational, and subimage-scaling errors. All of these parameters are evaluated using the reference image obtained from the ray-traced white image. The areas and center points of the microlens are estimated using an “8-connected” and a “center-of-gravity” method respectively. The proposed approach significantly improves the rectified-image quality and nonlinear image brightness for an IIM system. Numerical and optical experiments on multiple real objects demonstrate the robustness and effectiveness of our proposed method, which achieves on average a 35% improvement in brightness for an IIM raw image.
Keywords: Integral imaging microscopy system, Microlens array, Microscopy camera calibration, Rectification of microlens image
Integral-imaging microscopy (IIM) is a three-dimensional (3D) microscopy modality that senses differences in color intensity and depth within a single frame, through a microlens array (MLA) [1]. It provides detailed information on parallax and depth for various applications, including digital imaging involving super-resolution [2–4], depth mapping [5, 6], and 3D reconstruction [7]. In 1908, Gabriel Lippmann invented the first light-field camera, which he referred to as an “integral photography” device [8]; this camera had a carefully spaced lens array, to allow multiple photographs to be taken of a scene. Since its introduction, this camera has undergone numerous modifications, including changes in the camera array. Hand-held models have also been introduced [9].
In the basic IIM configuration, the elemental-image array (EIA) captured by the MLA holds a collection of subimages arranged in a particular sequence for 3D reconstruction [10], as shown in Fig. 1. The main purpose is to ensure efficient use of the IIM data during the processing and restoration of 3D images, where the raw image contains the depth information of the estimated target. However, fabrication and assembly limitations lead to defects in MLAs, including rotational [11, 12], translational [12], decentering [13], and pitch [11] errors. These errors diminish the quality, brightness, and resolution of the captured image, and make it difficult to determine the MLA’s location [13]. A large amount of detail in the raw image is lost or distorted, resulting in a significant decrease in target flow efficiency [14, 15]. Therefore, it is necessary to correct the distortions in IIM images caused by MLA errors.
Different calibration methods for microlens-based cameras have been suggested. Recent advances in light-field-camera technology have improved the precision of more recent configurations. Su
The methods in the abovementioned studies tend to idealize the MLA’s surface parameters, and only consider image distortion. However, the surface error of the MLA and its image-distortion error are not constant [21, 22]. Therefore, local deterioration caused by microlens surface errors cannot be efficiently rectified by integral methods; moreover, such techniques suffer from considerable computational complexity and negligible correction effects. The rotation-angle calculation depends on positional data, and involves precalculation of the system’s intrinsic parameters; this increases the required time and complexity of computations. There are also various, unavoidable device faults, such as distortion of the main lens, MLA translational errors, and scaling-factor errors between optical components.
In this study, we develop an IIM-camera calibration method based on ray tracing of the image, to address four types of error: MLA decentering, rotational, translational, and subimage-scaling errors. The effectiveness and reliability of the method are verified by comparing real-object images of different targets, before and after correction.
The IIM system consists of an objective lens, tube lens, MLA, and charge-coupled device (CCD). Fig. 1 illustrates the structural layout of the IIM-system model, in which the MLA is placed between the microscopy tube lens and CCD image sensor. Light information passes through the objective lens and microlenses of the MLA. An EIA is captured by the CCD, which in turn forms a series of subimages. An orthographic-view image (OVI) is produced from the EIA image’s information [10].
Suppose a specimen point with an initial coordinate (
where
Each microlens in the IIM camera forms a subimage on the CCD sensor that matches the directional light information. To acquire the correct image, the microlenses should be arranged in a matrix format, with parallel positioning of the image-sensor plane and MLA plane, in which the light rays strike each microlens at a different angle or projection. In the manufacturing and assembly process, the MLA is not aligned precisely with the image sensor. If there is an angle between the MLA and image sensor, rotational error occurs, as shown in Fig. 3(a).
In the IIM camera, translational error in the MLA leads to blurring and poor-quality digitally refocused images. Each microlens forms a subimage on the CCD sensor that corresponds to directional light information. When the microlenses are arranged, a fixed matrix format is needed for efficient use of the sensor pixels and subimages, with no crosstalk. Under this condition, any deviation in the horizontal or vertical position of the microlenses from their assumed, standard matrix position introduces translational error, as shown in Fig. 3(b).
In the MLA, deviation of the lens diameter of the microlens surface from the standard diameter introduces a scaling-factor error, as shown in Fig. 3(c). The lens-diameter selection is important, because it determines the light-propagation characteristics and field angle. The scaling process tends to maximize an object’s dimensions, based on its original coordinates, to achieve the desired result.
Analyses have shown that, in some subimages of the light field picture, error is caused by significant distortion related to a change in position, border scattering, and brightness variation [13]. Here, we introduce a method for calibrating a distorted IIM image using raw white images, as described in the following steps in Fig. 4.
To calibrate the error of an IIM image, a white-scene image consisting of 1856 × 1856 pixels is captured; notably, this image must be both white and homogeneous. A region of interest (ROI) is selected by cropping (
Here
The MLA translational error is illustrated in Fig. 6. Extracting the subimage from a white image is an important precondition for identifying the microlens gravity-index-shift error in the MLA as shown in Fig. 6(b). Each subimage contains 29 × 29 pixels. The subimage is transformed to a grayscale image, and Otsu’s method [23, 24] is utilized to convert the grayscale image to a binary one, as shown in Fig. 6 (c). For the binary image, we define each microlens as a distinct region using the circle-detection method. Fig. 6(d) presents the intermediate results of these steps. In this proposed method, the average translation position is calculated for each row and column based on the microlens’s center-pixel position, from which any deviation results in translational error. As a result, the original position is shifted to the average center direction, as shown in Fig. 7(b).
To address scaling-factor error, the subimage’s center position and area of light intensity must first be calculated. The determined scaling factor is applied to convert the original subimage to the maximum lenslet area, as shown in Fig. 7(c). In our experiments the maximum size of a single lenslet’s area is 29 × 29 pixels. The bilinear-interpolation technique is then utilized to maximize the subimage.
In this experiment we use a BX41 microscope (Olympus, Tokyo, Japan), as shown in Fig. 8, consisting of an objective lens, tube lens, lens array, CCD, and control computer. The lens array is arranged in a 100 × 100 square matrix. Each lenslet has an area of 125 × 125 µm2 and a spherical surface. Our method is implemented in the MATLAB® environment. Detailed specifications of the optical components and personal computer are given in Table 1.
TABLE 1. Specifications of the proposed Integral-imaging microscopy (IIM) calibration system.
Optical devices | Specifications | |
---|---|---|
IIM Unit | Objective lens | ×10 |
Tube lens | ×10 | |
MLA | Number of lens array | 100 × 100 (ROI 64 × 64) |
Elemental lens pitch | 125 μm | |
Camera | Sensor resolution | 2048 × 2048 pixels (RGB) |
Pixel pitch | 5.5 μm | |
Focal length | 2.4 mm | |
User PC | Frame rate | 90 fps |
CPU | Intel Core i5-9400F 2.9 GHz | |
Memory | 16 GB | |
Operating system | Windows 10 Pro (64-bit) |
The rectification method [25] is compared to the proposed method to verify the effectiveness, in terms of structural similarity index (SSIM) and mean squared error (MSE) values. In this system the MLA rotational errors are set from 0.1° to 1.0°. The comparison of results is shown in Fig. 9, based on different rotational factors. We find that the proposed method outperforms the traditional one in all cases. The SSIM and MSE values are almost similar.
Using the IIM method, our calibration method is applied to the IIM images of four specimens. Figure 10 shows the corresponding images, which include (i) a 2D image, (ii) the EIA used to capture the directional-view images, (iii) the initial OVI reconstructed using the computational integral-imaging reconstruction (CIIR) [26, 27] algorithm, and (iv) the final reconstructed OVI image. In this experiment the brightness of the initial OVI is not uniform, as shown in Fig. 10(iii). The image’s brightness improves after applying our proposed calibration method, as shown in Fig. 10(iv).
Figure 11 shows the percentage of bright pixels in each of the four initial and calibrated specimen OVIs. Our experimental results show that the proposed calibration method successfully enhances the uniform brightness of the images in the directional view. It is observed that the images of the microchip and sand crystal enjoy better results than those of the fly and mosquito, because of the light information. We can see from Fig. 10 that the microchip and sand crystal are brighter, causing more light reflection. Calibration does not have a huge effect on the weak-light-source area. For the same reason, the mosquito sample exhibits the worst performance.
In this work, we introduced a ray-tracing-based MLA calibration method for an IIM system. The goal was to minimize errors in MLA alignment, and thus improve image quality and brightness. The proposed method attenuated MLA errors using a reference image. An efficient error-detection and -correction method was proposed, in which a four-step calibration process is employed for EIA processing. Experiments with real IIM images showed that the proposed calibration method can accommodate nonlinear MLA errors to achieve an enhanced, error-free IIM image with improved brightness uniformity. Our experimental results for four images of various specimens (a fly, a microchip resistor, a mosquito, and a sand crystal) demonstrate that the proposed method has the robustness needed to correct for various errors. Future work is expected to include a more advanced lens-distortion model, which should improve the accuracy of the IIM image-capturing system by overcoming the various complexities associated with the microscope.
This work was supported by the National Research Foundation of Korea (NRF) (NRF-2018R1D1A3B07044041, NRF-2020R1A2C1101258), and was supported under the Grand Information Technology Research Center support program (IITP-2020-0-01462) supervised by the IITP (Institute for Information & communications Technology Planning & Evaluation), grant funded by the Korean government.
TABLE 1 Specifications of the proposed Integral-imaging microscopy (IIM) calibration system
Optical devices | Specifications | |
---|---|---|
IIM Unit | Objective lens | ×10 |
Tube lens | ×10 | |
MLA | Number of lens array | 100 × 100 (ROI 64 × 64) |
Elemental lens pitch | 125 μm | |
Camera | Sensor resolution | 2048 × 2048 pixels (RGB) |
Pixel pitch | 5.5 μm | |
Focal length | 2.4 mm | |
User PC | Frame rate | 90 fps |
CPU | Intel Core i5-9400F 2.9 GHz | |
Memory | 16 GB | |
Operating system | Windows 10 Pro (64-bit) |