Cited by (Korea DOI center) [18]
- 1.
"Effect of process conditions (withdrawal rate and coating repetition) on morphological characteristics of sol-gel TiO2 film during dip coating"
Journal of coatings technology and research,
vol. 17(5),
p.1171-.
2020.
doi:10.1007/s11998-020-00337-0
- 2.
"A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry"
International journal of precision engineering and manufacturing,
vol. 20(3),
p.463-.
2019.
doi:10.1007/s12541-019-00105-0
- 3.
"A Review of Thin-film Thickness Measurements using Optical Methods"
International journal of precision engineering and manufacturing,
vol. 25(8),
p.1725-.
2024.
doi:10.1007/s12541-024-00955-3
- 4.
"Facile and rapid fabrication of wearable biosensors via femtosecond laser-directed micro-patterning with large-sized reduced graphene oxide for physiological monitoring"
Chemical engineering journal,
vol. 479
p.147819-.
2024.
doi:10.1016/j.cej.2023.147819
- 5.
"Theoretical study of the normal-incidence reflective spectra for determining the thickness and refractive index of dielectric film"
Chinese journal of physics,
vol. 56(5),
p.2350-.
2018.
doi:10.1016/j.cjph.2018.05.028
- 6.
"In-situ thickness control of centimetre-scale 2D-Like polydopamine films with large scalability"
Materials today chemistry,
vol. 24
p.100935-.
2022.
doi:10.1016/j.mtchem.2022.100935
- 7.
"Nanowire Length, Density, and Crystalline Quality Retrieved from a Single Optical Spectrum"
Nano letters : a journal dedicated to nanoscience and nanotechnology,
vol. 19(4),
p.2509-.
2019.
doi:10.1021/acs.nanolett.9b00165
- 8.
"Microsphere-assisted hyperspectral imaging: super-resolution, non-destructive metrology for semiconductor devices"
Light, science & applications,
vol. 13(1),
p.122-.
2024.
doi:10.1038/s41377-024-01469-3
- 9.
"A novel method to design and evaluate artificial neural network for thin film thickness measurement traceable to the length standard"
Scientific reports,
vol. 12
p.2212-.
2022.
doi:10.1038/s41598-022-06247-y
- 10.
"A review on optical characterization of refractive index in photonic related devices and applications"
Journal of physics. D, applied physics,
vol. 57(48),
p.483002-.
2024.
doi:10.1088/1361-6463/ad6ba0
- 11.
"Super-resolution spectral interference fitting method for the simultaneous measurement of the thin film thickness and surface profile"
Measurement science & technology,
vol. 35(7),
p.075001-.
2024.
doi:10.1088/1361-6501/ad3a03
- 12.
"Thickness and refractive index measurements of a thin-film using an artificial neural network algorithm"
Metrologia,
vol. 60(2),
p.025001-.
2023.
doi:10.1088/1681-7575/acb70d
- 13.
"Optical method for simultaneous thickness measurements of two layers with a significant thickness difference"
Optics express,
vol. 29(20),
p.31615-.
2021.
doi:10.1364/OE.440507
- 14.
"Line spectroscopic reflectometry for rapid and large-area thickness measurement"
Optics express,
vol. 31(20),
p.32241-.
2023.
doi:10.1364/OE.501145
- 15.
"Color models of interference images of thin stratified objects in optical microscopy"
Komp㏓i&n.urligat;terna&n.illigat;&n.arligat; optika,
vol. 43(6),
p.956-.
2019.
doi:10.18287/2412-6179-2019-43-6-956-967
- 16.
"Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures"
Micromachines,
vol. 13(7),
p.1074-.
2022.
doi:10.3390/mi13071074
- 17.
"Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology"
Sensors,
vol. 21(10),
p.3340-.
2021.
doi:10.3390/s21103340
- 18.
"A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing"
Sensors,
vol. 23(11),
p.5326-.
2023.
doi:10.3390/s23115326